Cross-polarization pairing for label-free few-shot thin-section classification
Few-shot classifiers of rock thin sections are meta-trained on many rock types that a petrographer has identified slide by slide, and this identification is the costly step that new collections lack. We study few-shot recognition of unseen rock types when no training slide is identified, and the only information available is what the microscope records anyway: which slide an image comes from, and whether it was taken in plane-polarized (PPL) or cross-polarized (XPL) light. We first show why generic unsupervised pseudo-tasks fit this setting poorly: the positives they find without labels are either wrong or near-duplicates of the anchor, so they teach the model little. Polarized-light micr...
| Authors | Bingchen Yan |
|---|---|
| Primary category | cs.CV |
| Published | 17 October 2026 |
| Last updated at source | 17 October 2026 |
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