A Physics-Guided Transformer Framework for Electromigration Analysis in Multi-Segment Interconnects
As technology scales to smaller nodes, increasing current densities make electromigration (EM) one of the dominant reliability challenges in on-chip interconnects. Accurate transient stress analysis is needed to identify wires susceptible to EM degradation, but applying physics-based solvers across many interconnects remains computationally expensive. This paper proposes a physics-guided transformer framework for fast EM stress prediction in multi-segment interconnect lines. The framework converts each line into geometry- and DC-aware segment tokens and uses transformer attention to capture line-level context. A lightweight query decoder then predicts stress at selected locations and time...
| Authors | Pavlos Stoikos, Anuj Pathania, George Floros |
|---|---|
| Primary category | cs.LG |
| Published | 5 October 2026 |
| Last updated at source | 5 October 2026 |
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