A Digital Simulation Toolkit for Physics-Based Generation of Realistic Experimental Scanning Tunneling Microscopy Images
Scanning Tunneling Microscopy (STM) is a widely used tool for characterizing surfaces of materials at the atomic scale, playing a crucial role in discoveries across condensed matter physics and materials science. Despite its extreme spatial resolution, STM is one of the most sensitive microscopy techniques and is highly prone to noise. While existing unsupervised denoising methods are very cheap to train, these are primarily focused on removing the noise with minimal recovery of key physical information. While supervised methods can offer superior performance, the major bottleneck is that a large amount of paired clean-noisy experimental images is required which are impractical to obtain....
| Authors | Huanhuan Zhao, Laxmi Bhurtel, Connor Vernachio et al. |
|---|---|
| Primary category | cs.LG |
| Published | 29 September 2026 |
| Last updated at source | 29 September 2026 |
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