Improving Test-Time Scaling with Adaptive Looped Transformers
Looped transformers have demonstrated promising parameter efficiency by reusing layers for latent computation. Prior studies compare looped and non-looped models at matched parameters or per-token FLOPs. However, to the best of our knowledge, whether looping improves test-time scaling as outputs grow longer remains underexplored. Through post-training looped transformers, we study the accuracy-compute slope, measured as the accuracy gain per doubling of test-time decoding FLOPs. We find that existing looped transformers often yield steeper slopes than their non-looped baseline, yet underperform it at matched compute. While fixed-depth looping spends extra iterations on every token, our an...
| Authors | Yichen You, Tianyu Fu, Aosong Feng et al. |
|---|---|
| Primary category | cs.CL |
| Published | 28 September 2026 |
| Last updated at source | 28 September 2026 |
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