Universal Drift Correction for Multidimensional Scanning Microscopy
In scanning microscopy, drift causes the specimen to be sampled at positions displaced from the nominal probe positions. This displacement alters the spatial assignment of the recorded signals and biases quantitative measurements across two-dimensional imaging, channel-resolved spectroscopic mapping, and scan-position-resolved diffraction analysis. Here, we extend orthogonal-scan drift correction from 2D images to spectrum images and diffraction datasets. We demonstrate how to recover probe positions using either differently oriented multidimensional scans or structural reference images. The recovered positions are used either to resample the multidimensional data onto a regular grid or t...
| Authors | Sangjoon Lee, William Millsaps, Dasol Yoon et al. |
|---|---|
| Primary category | cond-mat.mtrl-sci |
| Published | 25 September 2026 |
| Last updated at source | 25 September 2026 |
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