A benchmark dataset and baseline methods for four-dimensional STEM diffraction patterns
Four-dimensional scanning transmission electron microscopy (4D-STEM) records a two-dimensional diffraction pattern at each electron-probe position, yielding spatially resolved reciprocal-space information but large, heterogeneous data volumes. Here we describe 4D-ImageNet, a collection of 174,000 diffraction patterns comprising 145,000 experimental patterns selected from 29 acquisitions and 29,000 multislice simulations. The experimental data cover acquisition-level labels for Ag, Au, mixed Au-Ag, CoO, Pd and ZnO specimens across multiple fields of view, scan dimensions, camera lengths and exposure times. Each acquisition contributes 5,000 quality-ranked patterns with source scan coordina...
| Authors | Yuyan Guan, Haoran Zhang, Zian Mao et al. |
|---|---|
| Primary category | cs.CV |
| Published | 18 September 2026 |
| Last updated at source | 18 September 2026 |
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