LUMIN: Lightweight Universal Manufacturing Inspection Network for Anomaly Detection
Industrial anomaly detection faces two engineering bottlenecks: memory bank construction latency and inference efficiency. Traditional sampling algorithms (Farthest Point Sampling, K-Means, etc.) rely on numerous backbone forward passes and iterative distance computations, with construction times ranging from minutes to hours; heavy computation components such as multi-scale feature extraction struggle to meet the millisecond-level real-time requirements of production lines. This paper focuses on sampling efficiency and inference optimization for industrial deployment with two core contributions: (1) PSP (Plugin Sampler Pipeline)---a four-stage adaptive memory bank sampling pipeline based...
| Authors | Pengfei Yang |
|---|---|
| Primary category | cs.CV |
| Published | 4 September 2026 |
| Last updated at source | 4 September 2026 |
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