An Interactive, Automated 4D-STEM data acquisition and analysis routine for Scanning Electron Nanobeam Diffraction and Ptychography experiments
Modern transmission electron microscopes are versatile instruments which have become indispensable tools for understanding structure and chemical composition at the nano- and atomic scale. In the physical sciences these instruments are still largely manually controlled, requiring significant operator expertise, limiting throughput, and precluding statistical analysis of large datasets. Recent technical advances in both hardware and in control software now allow for the interaction with almost every functionality of the microscope through a programming interface. This enables better experimental design and data collection automation while also reducing operator collection bias and required...
| Authors | Mohsen Danaie, Max England, Yiming Xu et al. |
|---|---|
| Primary category | physics.ins-det |
| Published | 13 August 2026 |
| Last updated at source | 13 August 2026 |
Silytics shows public metadata from arXiv and links to the original. Information may be incomplete or out of date. Last refreshed 17 October 2026. Licenses and terms of the original apply to the work itself. Not financial, legal or professional advice.