Multitask Scanning Probe Microscopy
Scanning probe microscopy provides nanoscale access to structural, electrical, electromechanical, magnetic, and mechanical properties of materials. Its increasing use for wafer-scale characterization and combinatorial materials exploration creates a need to distribute measurements efficiently across large spatial domains. This is particularly important when available modalities differ in acquisition time and potential for tip and sample damage, making exhaustive multimodal mapping over spatial grids impractical. Here, we demonstrate multitask scanning probe microscopy, a live, closed-loop workflow in which a multitask Gaussian process learns spatial and cross-modal relationships and auton...
| Authors | Aditya Raghavan, Yu Liu, Ian Mercer et al. |
|---|---|
| Primary category | cond-mat.mtrl-sci |
| Published | 10 August 2026 |
| Last updated at source | 10 August 2026 |
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