Sign inGet started
Paper · arXiv

Tight Sample Complexity of Transformers

We tightly characterize the VC dimension of depth-$L$ Transformers with a total of $W$ parameters, mapping an input sequence of length $T$ to a single output, establishing an upper bound of $O(L W \log (T W))$ and a nearly matching lower bound of $Ω(L W \log (T W / L))$. We further tightly characterize the sample complexity of chain-of-thought learning using such a Transformer, showing teacher forcing (i.e. selecting a predictor consistent with the entire chain-of-thought on training data) learns with sample complexity $O\left(L W \log \left(\left(T+T^{\prime}\right) W\right)\right)$ and that any learning rule that uses chain-of-thought data requires at least $Ω\left(L W \log \left(\left(...

AuthorsChenxiao Yang, Nathan Srebro, Zhiyuan Li
Primary categorycs.LG
Published8 June 2026
Last updated at source23 July 2026
cs.LG
Embed this entry
<iframe src="https://silytics.si/embed/item/93a33c24-b4db-4cb1-b055-15bbbbd18e10" width="420" height="190" style="border:0" loading="lazy" title="Silytics entry"></iframe>

Free, no tracking. More about feeds and embeds.

Silytics shows public metadata from arXiv and links to the original. Information may be incomplete or out of date. Last refreshed 17 October 2026. Licenses and terms of the original apply to the work itself. Not financial, legal or professional advice.