Characterizing the Fault Response of the Intel Neural Compute Stick 2 Under Single-Pulse Electromagnetic Fault Injection
Vision processing units and other commercial neural-network inference accelerators are increasingly deployed in safety-relevant edge applications, but their fault response under transient hardware disturbances remains poorly characterized in the open literature. For the Intel Movidius Myriad X, packaged as the Intel Neural Compute Stick 2 (NCS2), only a single feasibility study has been published. We report a systematic single-pulse electromagnetic fault injection (EMFI) campaign on the NCS2 running three ImageNet-trained convolutional neural networks (ResNet-18, ResNet-50, VGG-11) on the OpenVINO runtime. Across 1,536 spot-test trials at characterized hotspots and approximately 16,000 pa...
| Authors | Štefan Kučerák, Jakub Breier, Xiaolu Hou |
|---|---|
| Primary category | cs.CR |
| Published | 21 May 2026 |
| Last updated at source | 21 May 2026 |
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