Hybrid Quantum-MambaVision: A Quantum-enhanced State Space Model for Calibrated Mixed-type Wafer Defect Detection
Extracting actionable knowledge from industrial visual data is fundamentally bottlenecked by extreme class imbalance and the prohibitive computational complexity of modern foundation models. In semi-conductor manufacturing, identifying multi-label wafer defects is a complex spatial data mining task where overlapping patterns obscure critical root-cause signals. While Vision Transformers (ViTs) excel at global dependency extraction, their quadratic scaling renders them inefficient for high-throughput, real-time anomaly detection. To overcome these computational barriers, this paper introduces Hybrid Quantum-MambaVision, a highly efficient architecture tailored for spatial knowledge discove...
| Authors | Satwik Sai Prakash Sahoo, Jyoti Prakash Sahoo, Ting Wang et al. |
|---|---|
| Primary category | cs.CV |
| Published | 13 May 2026 |
| Last updated at source | 13 May 2026 |
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