Contrastive Image-Metadata Pre-Training for Materials Transmission Electron Microscopy
The transmission electron microscope facilitates the highest-resolution imaging of any instrument ever created, and its limiting factor is no longer spatial resolution but dose efficiency. Low electron doses avoid sample damage but produce noisy images for which, unlike in classical computer vision, there is no ground truth. Autonomous materials experimentation poses a related problem, since closed-loop instruments need representations grounded in the microscope state at acquisition. Both demand representations grounded in how an image was acquired. We release 7,330 paired high-angle annular dark-field scanning-TEM (HAADF-STEM) images and their seven-dimensional acquisition metadata, and ...
| Authors | Georgia Channing, Debora Keller, Marta D. Rossell et al. |
|---|---|
| Primary category | cs.LG |
| Published | 27 April 2026 |
| Last updated at source | 7 May 2026 |
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