Quality-preserving Model for Electronics Production Quality Tests Reduction
Manufacturing test flows in high-volume electronics production are typically fixed during product development and executed unchanged on every unit, even as failure patterns and process conditions evolve. This protects quality, but it also imposes unnecessary test cost, while existing data-driven methods mostly optimize static test subsets and neither adapt online to changing defect distributions nor explicitly control escape risk. In this study, we present an adaptive test-selection framework that combines offline minimum-cost diagnostic subset construction using greedy set cover with an online Thompson-sampling multi-armed bandit that switches between full and reduced test plans using a ...
| Authors | Noufa Haneefa, Teddy Lazebnik, Einav Peretz-Andersson |
|---|---|
| Primary category | cs.LG |
| Published | 7 April 2026 |
| Last updated at source | 7 April 2026 |
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