A Mixture of Experts Foundation Model for Scanning Electron Microscopy Image Analysis
Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by task-specific models and labor-intensive acquisition processes that limit its scalability across diverse applications. Here, we introduce the first foundation model for SEM images, pretrained on a large corpus of multi-instrument, multi-condition scientific micrographs, enabling generalization across diverse material systems and imaging conditions. Leveraging a self-supervised transformer architecture, our model learns rich and transferable representations th...
| Authors | Sk Miraj Ahmed, Yuewei Lin, Chuntian Cao et al. |
|---|---|
| Primary category | cs.LG |
| Published | 7 April 2026 |
| Last updated at source | 7 April 2026 |
Silytics shows public metadata from arXiv and links to the original. Information may be incomplete or out of date. Last refreshed 17 October 2026. Licenses and terms of the original apply to the work itself. Not financial, legal or professional advice.