3D Gaussian Splatting for Annular Dark Field Scanning Transmission Electron Microscopy Tomography Reconstruction
Analytical Dark Field Scanning Transmission Electron Microscopy (ADF-STEM) tomography reconstructs nanoscale materials in 3D by integrating multi-view tilt-series images, enabling precise analysis of their structural and compositional features. Although integrating more tilt views improves 3D reconstruction, it requires extended electron exposure that risks damaging dose-sensitive materials and introduces drift and misalignment, making it difficult to balance reconstruction fidelity with sample preservation. In practice, sparse-view acquisition is frequently required, yet conventional ADF-STEM methods degrade under limited views, exhibiting artifacts and reduced structural fidelity. To re...
| Authors | Beiyuan Zhang, Hesong Li, Ruiwen Shao et al. |
|---|---|
| Primary category | cs.CV |
| Published | 6 April 2026 |
| Last updated at source | 6 April 2026 |
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