Inverse Design of Optical Multilayer Thin Films using Robust Masked Diffusion Models
Inverse design of optical multilayer stacks seeks to infer layer materials, thicknesses, and ordering from a desired target spectrum. It is a long-standing challenge due to the large design space and non-unique solutions. We introduce \texttt{OptoLlama}, a masked diffusion language model for inverse thin-film design from optical spectra. Representing multilayer stacks as sequences of material-thickness tokens, \texttt{OptoLlama} conditions generation on reflectance, absorptance, and transmittance spectra and learns a probabilistic mapping from optical response to structure. Evaluated on a representative test set of 3,000 targets, \texttt{OptoLlama} reduces the mean absolute spectral error...
| Authors | Jonas Schaible, Asena Karolin Özdemir, Charlotte Debus et al. |
|---|---|
| Primary category | physics.optics |
| Published | 1 April 2026 |
| Last updated at source | 1 April 2026 |
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