Bi-directional digital twin prototype anchoring with multi-periodicity learning for few-shot fault diagnosis
Intelligent fault diagnosis (IFD) has emerged as a powerful paradigm for ensuring the safety and reliability of industrial machinery. However, traditional IFD methods rely heavily on abundant labeled data for training, which is often difficult to obtain in practical industrial environments. Constructing a digital twin (DT) of the physical asset to obtain simulation data has therefore become a promising alternative. Nevertheless, existing DT-assisted diagnosis methods mainly transfer diagnostic knowledge through domain adaptation techniques, which still require a considerable amount of unlabeled data from the target asset. To address the challenges in few-shot scenarios where only extremel...
| Authors | Pengcheng Xia, Zhichao Dong, Yixiang Huang et al. |
|---|---|
| Primary category | cs.AI |
| Published | 7 March 2026 |
| Last updated at source | 7 March 2026 |
Silytics shows public metadata from arXiv and links to the original. Information may be incomplete or out of date. Last refreshed 17 October 2026. Licenses and terms of the original apply to the work itself. Not financial, legal or professional advice.