Dataset · Hugging Face
lslattery/wafer-defect-detection
Dataset used by the paper: Wu, Ming-Ju, Jyh-Shing R. Jang, and Jui-Long Chen. “Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets.” IEEE Transactions on Semiconductor Manufacturing 28, no. 1 (February 2015): 1–12.
| Author / organization | lslattery |
|---|---|
| Downloads | 621 (as reported by Hugging Face) |
| Likes | 1 |
| Created | 8 August 2022 |
| Last updated at source | 14 August 2022 |
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